A probe station is an interface tool to measure the electrical characteristics of your microelectronic device. For example, if you are unable to see the inputs and outputs of your DUT precisely with the naked eye, a probe station is what you need to perform measurements, whether it be a wafer, glass, MEMS etc. However, the station requires a combination of a microscope and micropositioners to facilitate the experiment. When integrated, users can accurately make contact to their devices with probes and measure with electronic meters to see your results.
Everbeing’s four point probe uses the four co-linear probes on contact to determine the sheet resistance of your wafer or thin films. The method uses the four terminal sensing or “Kelvin” approach by using separate junctions for voltage and current instead of through the same connection. As a result, internal resistance, lead or contact resistance is reduced and lower ohm values can be read.