Atomic Force Microscope (AFM) | HORIBA Scientific

The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source).

TERS  (Tip-Enhanced Raman Spectroscopy) and TEPL (Tip-Enhanced PhotoLuminescence)can provide nano-scale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.