The Kelvin Probe is a non-contact, non-destructive vibrating capacitor device used to measure the work function (wf) of conducting materials or surface potential (sp) of semiconductor or insulating surfaces. The Kelvin Probe does not actually touch the surface; rather an electrical contact is made to another part of the sample or sample holder.
We are proud distributors of the Kelvin Probe systems from KP Technology, one of the top developers of the Kelvin Probe Systems.
Kelvin Probe Systems
Controlled Atmosphere Kelvin Probe System
Monitor CPD or work function (Φ) with humidity control functions
Scanning Probe Systems
Standard 2 mm gold tip Work function resolution: 1 - 3 meV
Single-Point Kelvin Probe
High-Performing & Quick readings at 300 work functions/min
Surface Photovoltage
Ideal for detailed measurements for light sensitive materials
Ultra-High Vacuum
*NEW* UHVKP Corner Cube
Full access to work function and contact potential difference (CPD) measurements under vacuum.
Ultra-high Vacuum Ф4 Kelvin Probe
Ultra-high vacuum KP with temperature control from -196°C-586°C.
Ultra-high Vacuum Scanning Kelvin Probe
Ultra-high Vacuum KP with a scanning area of 20 x 20mm.
