Spectroscopic ellipsometry (SE) is a surface sensitive, non-destructive, and non-intrusive optical metrology technique used for determining the dielectric properties & thickness of thin films.

SE is ideal to characterise materials in thin film applications and are widely used across many fields. Ellipsometry has gained more importance following the trend in research semiconductors, optoelectronics, optical and functional coatings, surface chemistry, biotechnology and especially in the rising fame solar panels.