Analytical Technologies Singapore


Spectroscopic ellipsometry (SE) is a surface sensitive, non-destructive, and non-intrusive optical metrology technique used for determining the dielectric properties & thickness of thin films.

Spectroscopic ellipsometry (SE) is ideal to characterise materials in thin film applications and are widely used across many fields. Ellipsometry has gained more importance following the trend in research semiconductors, optoelectronics, optical and functional coatings, surface chemistry, biotechnology and especially in the rising fame solar panels.

We distribute our Spectroscopic Ellipsometer from HORIBA.


In-situ Ellipsometry

Full-package in-line measurement w ultra fast speed of 50ms per data


New generation ellipsometer that measures up to micro & nano layers

Smart SE

Versatile ellipsometer for quick & accurate thin-film measurements

Auto SE

Fully automated w XYZ stage that measures real-time imaging


Equipped w double modulation with characterisation from FUV-NIR


Fastest ellipsometer the widest spectral range; from VUV to NIR

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