Analytical Technologies Singapore

Spectroscopic ellipsometry (SE) is a surface sensitive, non-destructive, and non-intrusive optical metrology technique used for determining the dielectric properties & thickness of thin films.

SE is ideal to characterise materials in thin film applications and are widely used across many fields. Ellipsometry has gained more importance following the trend in research semiconductors, optoelectronics, optical and functional coatings, surface chemistry, biotechnology and especially in the rising fame solar panels.

Spectroscopic Ellipsometer

Smart SE Ellipsometry Singapore HORIBA Analytical Technologies

Smart SE

Powerful and Cost Effective Spectroscopic Ellipsometer

Auto SE Ellipsometry Singapore HORIBA Analytical Technologies

Auto SE

Fully automated w XYZ stage that measures Simple Thin Film Measurement


Equipped w double modulation with characterisation from FUV-NIR: 190 to 2100 nm

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