Kelvin Probe System

The Kelvin Probe is a non-contact, non-destructive vibrating capacitor device used to measure the work function (wf) of conducting materials or surface potential (sp) of semiconductor or insulating surfaces. The Kelvin Probe does not actually touch the surface; rather an electrical contact is made to another part of the sample or sample holder.

We are proud distributors of the Kelvin Probe systems from KP Technology, one of the top developers of the Kelvin Probe Systems. 

KP Instruments

Ambient Pressure Photoemission Spectroscopy

APS system using photomission

Single-Point Kelvin Probe

High-Performing & Quick readings at 300 work functions/min

APS with Nitrogen Environment

Absolute functioning even under N2

Surface Photovoltage

Ideal for detailed measurements for light sensitive materials

Relative Humidity Kelvin Probe

Monitor CPD or work function (Φ) with humidity control functions

Scanning Probe Station

High-quality optical/Faraday enclosure shields to stabilise environment

Ultra-High Vacuum

Ultra-high Vacuum Kelvin Probe

Measures CPD under vacum

Ultra-high Vacuum Scanning Kelvin Probe

Ultra-high Vacuum KP with a scanning area of 20 x 20mm.

Ultra-high Vacuum Ф4 Kelvin Probe

Ultra-high vacuum KP with temperature control from -196°C-586°C

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