Analytical Technologies Singapore

Installation

Installation of SKP5050 by KP Technology

Installation of KP Technology’s latest Scanning Kelvin Probe Systems – SKP5050. For more information, please contact us.

About Scanning Kelvin Probe

Scanning Kelvin Probes give the user full access to 2D and 3D work function plots of samples ranging in size from 50 mm to 350mm. 

With work function resolution of 1-3 meV, and the spatial resolution of the probe tip diameter, the Scanning Kelvin Probe gives reliable, repeatable measurements for work function (Φ) and contact potential difference (CPD) measurements. 

Effects of corrosion can be measured across a surface with high precision e.g. coating uniformity and performance. A Faraday enclosure shields all of our scanning systems from unwanted ambient light, fast changing environmental conditions, electromagnetic interference and provides the perfect platform for our Ambient-pressure Photoemission Spectroscopy (APS) and Surface Photovoltage add-on modules.

Find out more about the different types of Kelvin Probes here. 

Upgrades & Add-Ons

  • Ambient-pressure Photoemission Spectroscopy (APS)
  • Surface Photovoltage Spectroscopy (400-1000nm) 
  • Surface Photovoltage (QTH or LED) 
  • Sample heater to 250°C 
  • Relative humidity control and/or nitrogen environmental chamber 
  • Tips: 0.05mm to 2.00mm

Credits: KP Technology

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Installation of PIV system from LaVision

PIV set-up & calibration with LaVision with laser from the top
Side profile of PIV set-up
This LaVision High-Speed 2D PIV System is employed to acquire comprehensive insights into the swash flows generated by a train of solitary waves and the concurrent turbulence structure. This system conducts two-dimensional velocity measurements utilising a 100-Hz high-speed particle image velocimetry (HSPIV) technique.
 
LaVision’s flow field imaging laser systems, known as FlowMaster, leverage cutting-edge Particle Image Velocimetry (PIV) techniques.

The study of turbulent combustion greatly hinges on flow-chemistry interactions. Our high-speed laser imaging technology, which incorporates both PIV and OH-PLIF simultaneously within the same light sheet plane, enables the exploration of these intricate flow-flame interactions inherent in phenomena like ignition and flame extinction processes. LaVision’s laser imaging framework uniquely facilitates such concurrent PIV and PLIF measurements, supported by our established FlowMaster and FlameMaster systems, both utilising the DaVis platform for synchronised image capture and data processing.
PIV components: Programmable Timing Unit (on top of table)
Close up look of PIV highspeed camera (bottom)
LaVision creates personalised solutions using the different techniques such as Particle Imagine Velocity PIV – based on your experiments & projects. Read more about the different techniques available; alternatively you may contact us for more information. 
Running through LaVision software DaVis
Training staff of FlameMaster series

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Installation for aixDBLI Industrial Line

Technical servicing of axiDBLI full system with software

Our engineering team has assisted aixacct in the technical support in the aixDBLI system. 

The Industrial Line DBLI systems offers manufacturers of piezoelectric MEMS products the ability to monitor quality in the production process for the first time.

Stage with aixDBLI probe stage for testing
Side profile of the testing stage

VERIFIED THIN FILM QUALITY FOR FLAWLESS COMPONENTS

With a DBLI system from our Industrial Line, you can test whether the piezoelectric behaviour of your thin films meets your requirements and ensure consistent performance across the wafer. All this early on in the production process before the films are processed further to form the finished component. Fully or semi-automated quality control lets you achieve outstanding reliability and reproducibility in your production. You can benefit from excellent production efficiency and maximum output, with flawless components.

aixDBLI software system
Full aixDBLI system

EASY TO OPERATE AT ALL TIMES

​The systems in our aixDBLI Industrial Line are fitted with an industrial probe from Formfactor (formally Süss Microtech). A wafer handler can also be fitted as an optional extra, enabling you to measure wafers fully automatically. Our DBLI Commander control software means the measurement system could not be easier to use. On top of this, handling with automatic alignment and pattern recognition ensures reliable measurement data across users. Different operator levels give you access to all parameters. Alongside a wafer map editor and recipe editor, you can also choose from a range of measurement modes. A SecsGEM interface allows the system to communicate with higher-level production management software.

FEATURES & BENEFITS

  • Quality control of the separated film before further processing
  • Differentiation between material faults on the thin film and component failure
  • Wafer mapping enables homogeneity testing and delivers feedback for process optimisation
  • Unique resolution of over 1 pm for process-sensitive monitoring of the most important parameters d33,f and e31,f
  • Thin film and component testing in a single system thanks to a combination of DBLI and SBLI technology
  • Monitoring of other characteristic values, such as breakdown voltage, leakage current, epsilon and loss factor

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Customisation of Large Area PCB Probe Station with EVERBEING

This was a customised solutions that Analytical Technologies has worked with EVERBEING for probing onto your PCB boards, accommodating a range of sizes according to your specifications. Our stations seamlessly integrate with various applications, including DC, RF, mmW, and High Temperature capabilities. Certain models also support double-sided probing (top and bottom) for enhanced versatility.
 
Please find the link below to access the complete inventory of available probe stations, which includes detailed information about the Large Area PCB Probe Station.

Alternatively, feel free to reach out to us directly to discuss customizing a probe station tailored to your project requirements.

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NanoRaman Set up with Bioptentiostat for Tip Enhanced Raman Spectroscopy (TERS) Application

The NanoRaman system equipped with LabRAM Evolution being installed locally by Analytical Technologies’ in-house team.

LabRAM Evolution, the world renowned Raman solution for research and analysis. The integral flexibility of the LabRAM HR Evolution makes it the ideal platform for combined with the fully integral nano-Raman for research to TERS (tip enhanced Raman scattering).  

TERS Tip
Raman Microscope

A close up of the integration of a customised environmental chamber and electrochemical cell within a NanoRaman (as shown above) setup designed a sophisticated and versatile experimental configuration to enhance the capabilities of this analytical instrument.

This integrated system is further augmented by the inclusion of a bipotentiostat, a critical component for conducting Tip Enhanced Raman Spectroscopy (TERS) experiments.  

Personalised hands-on guidance and training provided by a HORIBA’s application scientist represents a valuable and tailored educational experience designed to empower researchers, technicians, and users with the skills and knowledge required to make the most effective use of HORIBA’s instruments. 

Another angle of the HORIBA’s LabRAM HR Evolution Setup before the integration of NanoRaman, with HORIBA’s in-house software installed in the computer (right). 

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Installation of LabRAM Evolution Confocal MicroRAMAN System

Our local technical support team has successfully commissioned a semiconductor variant of the world renowned LabRAM Evolution Confocal MicroRaman System.  Fully equipped with multiple lasers from UV to NIR and  unique upgrades, the system is able to handle Raman as well as Photoluminescence measurements.

The LabRAM Confocal MicroRaman system microscopes are ideally suited for both micro and macro measurements, and offer advanced confocal imaging capabilities in 2D and 3D. The true confocal Raman microscope enables the most detailed images and analyses to be obtained with speed and confidence.  It is widely used for standard Raman analysis such as PhotoLuminescence (PL), it can also be further integrated for other hybrid analysis.

The system was enclosed using a customised laser safety curtain that was customised & designed by our engineers. The implementation of a custom laser safety curtain around the system is a critical safety measure that protects the well-being of lab personnel. 

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