Analytical Technologies Singapore


Installation of SKP5050 by KP Technology

Installation of KP Technology’s latest Scanning Kelvin Probe Systems – SKP5050. For more information, please contact us.

About Scanning Kelvin Probe

Scanning Kelvin Probes give the user full access to 2D and 3D work function plots of samples ranging in size from 50 mm to 350mm. 

With work function resolution of 1-3 meV, and the spatial resolution of the probe tip diameter, the Scanning Kelvin Probe gives reliable, repeatable measurements for work function (Φ) and contact potential difference (CPD) measurements. 

Effects of corrosion can be measured across a surface with high precision e.g. coating uniformity and performance. A Faraday enclosure shields all of our scanning systems from unwanted ambient light, fast changing environmental conditions, electromagnetic interference and provides the perfect platform for our Ambient-pressure Photoemission Spectroscopy (APS) and Surface Photovoltage add-on modules.

Find out more about the different types of Kelvin Probes here. 

Upgrades & Add-Ons

  • Ambient-pressure Photoemission Spectroscopy (APS)
  • Surface Photovoltage Spectroscopy (400-1000nm) 
  • Surface Photovoltage (QTH or LED) 
  • Sample heater to 250°C 
  • Relative humidity control and/or nitrogen environmental chamber 
  • Tips: 0.05mm to 2.00mm

Credits: KP Technology

Installation of PIV system from LaVision

PIV set-up & calibration with LaVision with laser from the top
Side profile of PIV set-up
This LaVision High-Speed 2D PIV System is employed to acquire comprehensive insights into the swash flows generated by a train of solitary waves and the concurrent turbulence structure. This system conducts two-dimensional velocity measurements utilising a 100-Hz high-speed particle image velocimetry (HSPIV) technique.
LaVision’s flow field imaging laser systems, known as FlowMaster, leverage cutting-edge Particle Image Velocimetry (PIV) techniques.

The study of turbulent combustion greatly hinges on flow-chemistry interactions. Our high-speed laser imaging technology, which incorporates both PIV and OH-PLIF simultaneously within the same light sheet plane, enables the exploration of these intricate flow-flame interactions inherent in phenomena like ignition and flame extinction processes. LaVision’s laser imaging framework uniquely facilitates such concurrent PIV and PLIF measurements, supported by our established FlowMaster and FlameMaster systems, both utilising the DaVis platform for synchronised image capture and data processing.
PIV components: Programmable Timing Unit (on top of table)
Close up look of PIV highspeed camera (bottom)
LaVision creates personalised solutions using the different techniques such as Particle Imagine Velocity PIV – based on your experiments & projects. Read more about the different techniques available; alternatively you may contact us for more information. 
Running through LaVision software DaVis
Training staff of FlameMaster series

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Installation for aixDBLI Industrial Line

Technical servicing of axiDBLI full system with software

Our engineering team has assisted aixacct in the technical support in the aixDBLI system. 

The Industrial Line DBLI systems offers manufacturers of piezoelectric MEMS products the ability to monitor quality in the production process for the first time.

Stage with aixDBLI probe stage for testing
Side profile of the testing stage


With a DBLI system from our Industrial Line, you can test whether the piezoelectric behaviour of your thin films meets your requirements and ensure consistent performance across the wafer. All this early on in the production process before the films are processed further to form the finished component. Fully or semi-automated quality control lets you achieve outstanding reliability and reproducibility in your production. You can benefit from excellent production efficiency and maximum output, with flawless components.

aixDBLI software system
Full aixDBLI system


​The systems in our aixDBLI Industrial Line are fitted with an industrial probe from Formfactor (formally Süss Microtech). A wafer handler can also be fitted as an optional extra, enabling you to measure wafers fully automatically. Our DBLI Commander control software means the measurement system could not be easier to use. On top of this, handling with automatic alignment and pattern recognition ensures reliable measurement data across users. Different operator levels give you access to all parameters. Alongside a wafer map editor and recipe editor, you can also choose from a range of measurement modes. A SecsGEM interface allows the system to communicate with higher-level production management software.


  • Quality control of the separated film before further processing
  • Differentiation between material faults on the thin film and component failure
  • Wafer mapping enables homogeneity testing and delivers feedback for process optimisation
  • Unique resolution of over 1 pm for process-sensitive monitoring of the most important parameters d33,f and e31,f
  • Thin film and component testing in a single system thanks to a combination of DBLI and SBLI technology
  • Monitoring of other characteristic values, such as breakdown voltage, leakage current, epsilon and loss factor

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Customisation of dark Enclosure

Dark Enclosure (Closed)
Dark Enclosure (Opened) with Switches

Looking for a controlled environment within an open lab for your experiments?

Our team of engineers specialises in crafting customised dark enclosures tailored to seamlessly fit your workspace. These enclosures not only provide the necessary controlled conditions but also come equipped with safety switches, ensuring a secure and optimised environment for your experiments.

Click the link here to view a different enclosure with HEPA filter.

Dark Enclosure with HEPA Filters
Side Angle of Dark Enclosure (Opened)

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Customisation of Large Area PCB Probe Station with EVERBEING

This was a customised solutions that Analytical Technologies has worked with EVERBEING for probing onto your PCB boards, accommodating a range of sizes according to your specifications. Our stations seamlessly integrate with various applications, including DC, RF, mmW, and High Temperature capabilities. Certain models also support double-sided probing (top and bottom) for enhanced versatility.
Please find the link below to access the complete inventory of available probe stations, which includes detailed information about the Large Area PCB Probe Station.

Alternatively, feel free to reach out to us directly to discuss customizing a probe station tailored to your project requirements.

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Horiba Debuts new Raman Microscope for Semiconductor Analyses

HORIBA is pleased to introduce the latest addition to its repertoire, the LabRAM Odyssey Semiconductor system. This pioneering Raman/Photoluminescence microscope derives its foundation from the widely acclaimed LabRAM HR Evolution Confocal Raman Microscope, renowned for its exceptional high resolution capabilities. Noteworthy enhancements include the integration of a sample mounting stage adept at accommodating the prevalent 300 mm wafer size, catering directly to the semiconductor industry’s standard requirements.
As compound semiconductors are becoming more complex with a higher number of elements, uniformity assessment on blanket wafers is essential for high quality devices and high yield. The LabRAM Odyssey Semiconductor system will help process engineers qualify the different process steps in a timely manner and with a high level of confidence. With a high spatial resolution mode, the LabRAM Odyssey Semiconductor offers the capability to detect and identify defects and submicron inhomogeneities to understand and give insights about their origin.

The LabRAM Odyssey Semiconductor system includes a 300 mm × 300 mm automated sample stage and an automated objective turret, enabling the acquisition of maps of full wafers of diameter up of 300 mm.  In addition, the DuoScan imaging function permits both variable size laser macrospot for full wafer maps and high spatial submicron step scanning for small area maps.  The range of available excitation lasers, combined with a wide range of spectral detection, from deep UV to near IR, makes the LabRAM Odyssey Semiconductor system a two-in-one Raman and Photoluminescence spectroscopy tool. The “Tilt at midway” autofocus function overcomes possible sample/holder tilt and ensures reliability in uniformity response.

As Raman and Photoluminescence characterisation is moving from the lab to the fab for the emerging 2D materials-based devices, the LabRAM Odyssey Semiconductor system is the perfect tool for metrology technical managers.