Raman and AFM (Atomic Force Microscope) analysis can be combined on a single microscope system, opening interesting new capabilities and providing enhanced information on sample composition and structure by collecting physical and chemical information on the same sample area. Co-localized AFM/Raman measurement is the sequential or simultaneous acquisition of overlapped SPM (Scanning Probe Microscope) and Raman maps with pixel-to-pixel correspondence in the images.
In the polymer field, Raman microscopy has become one of
Structural characterization of WS2 flakes by Photoluminescence and ultra-low frequency Raman spectroscopy on a unique multimode platform
2D materials are best characterised using both Photoluminescence (PL) &
HORIBA’s newest creation, LabRAM Soleil Raman Microscope is a automated